MRC | Criteria | Characteristic |
---|---|---|
ABMZ | DIAMETER | 0.375 INCHES NOMINAL |
ADQB | SECURING DEVICE TYPE | SPRING |
AGRD | TURNLOCK STUD HEAD STYLE | STUD HEAD |
AGRE | STUD ASSEMBLY STYLE | STUD ASSEMBLY |
AGRF | DISTANCE FROM ENGAGING MEMBER TO LARGEST BEARING SURFACE OF HEAD | 0.255 INCHES NOMINAL |
AGRH | EYELET OUTSIDE DIAMETER | 0.450 INCHES NOMINAL |
AGRJ | STUD DIAMETER | 0.215 INCHES NOMINAL |
AGRK | EYELET LENGTH | 0.110 INCHES NOMINAL |
AGSM | MATERIAL ACCOMMODATED THICKNESS | 0.094 INCHES NOMINAL |
CQYY | STUD HEAD HEIGHT | 0.450 INCHES NOMINAL |
MATT | MATERIAL | STEEL COMP 1010 OVERALL OR STEEL COMP 1118 OVERALL |
SFTT | SURFACE TREATMENT | CADMIUM OVERALL AND CHROMATE OVERALL |
STDC | SURFACE TREATMENT DOCUMENT AND CLASSIFICATION | QQ-P-416,TYPE 2,CLASS 2 FED SPEC ALL TREATMENT RESPONSES OVERALL |
If You’d Like to Stay Updated On Our Latest Promotions, You Can Download the ASAP Semiconductor App from the App Store and Google Play Store.
Request for Quote